Failure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering

Suhir E

doi:10.19070/2470-4415-1900022

Abstract

Failure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering

Highlights

The almost forty years old highly accelerated life testing (HALT) is currently widely employed, in different modifications, to determine, as it is believed, an electronic product’s reliability weaknesses, assess its reliability limits, and ruggedized the product by applying elevated stresses that could cause field failures
Its end point is defined by the predetermined number or percent of failures, if any, and its follow up activity is failure analysis
Failure Oriented Accelerated Testing (FOAT) could be viewed as an extension or a modification of HALT

Summary

Introduction

The almost forty years old highly accelerated life testing (HALT) is currently widely employed, in different modifications, to determine, as it is believed, an electronic product’s reliability weaknesses, assess its reliability limits, and ruggedized the product by applying elevated stresses (not necessarily mechanical and not necessarily limited to the anticipated field stresses) that could cause field failures. The equation (8) has three unknowns: the activation energy U0 and two sensitivity factors: the applied stress factor γ and the testing time factor γt.

Results

Conclusion