Abstract
Demand for increased data storage has resulted in the development of various types of magnetic tape. To achieve higher recording density, tape manufacturers are developing thin-film tapes, such as advanced metal evaporated (AME) tape, for use in linear tape drives. The structure of AME tape is fundamentally different from metal particulate (MP) tape. The goal of this study was to determine the methods and mechanisms associated with failure of AME tapes as well as to investigate the effect of tape cupping and initial edge quality on tape durability in an advanced linear tape drive. It is shown that AME tape exhibits a slightly lower coefficient of friction than the MP. The negatively cupped AME tape demonstrated a greater value of lateral tape motion peak-to-peak amplitude than both of the positively cupped AME samples as well as the MP tape sample. It was found that poor initial tape edge condition plays a large role in debris generation. For these reasons, positively cupped AME tapes with good initial relative edge contour are recommended for use in linear tape drives. The dominant mechanism of failure for the AME samples is adhesive wear resulting in removal of the DLC overcoats and sublayers. Review led by Tom Karis
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