Abstract

Reliability study of electronic system with the physics-of-failure method has been promoted due to the increase knowledge of electronic failure mechanisms. System failure initiates from independent failure mechanisms, have effect on or affect by other failure mechanisms and finally result in system failure. Failure mechanisms in a non-repairable system have many kinds of correlation. One failure mechanism developing to a certain degree will trigger, accelerate or inhibit another or many other failure mechanisms, some kind of failure mechanisms may have the same effect on the failure site, component or system. The destructive effect will be accumulated and result in early failure. This paper presents a reliability evaluation method considering correlativity among failure mechanisms, which includes trigger, acceleration, inhibition, accumulation, and competition. Based on fundamental rule of physics of failure, decoupling methods of these correlations are discussed. With a case, reliability of electronic system is evaluated considering failure mechanism dependence.

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