Factors that govern sub-3 nm particle measurements in an Airmodus® PSM and a TSI® DEG–SMPS

Abstract

Measurements of sub-3 nm particles are technically challenging and characterized with significant uncertainties. This study selected two types of widely used commercial instruments: an Airmodus® Particle Size Magnifier (PSM) and a TSI® diethylene glycol-based Scanning Mobility Particle Sizer (DEG–SMPS), and examined factors that govern their abilities on measurements of sub-3 nm particles. Monodisperse standard particles used in the experiments include positively and negatively charged tungsten oxide particles and nickel–chromium (Ni/Cr) oxide particles, positive and negative ions produced in a soft X-ray neutralizer, and positively charged organic particles including tetraheptylammonium bromide (THABr), tetrabutylammonium bromide (TBABr), and polyethylene glycol (PEG) particles. Our results show that both PSM and DEG–SMPS are subject to the influence of particle composition. Negatively charged tungsten oxide particles were detected at higher efficiencies than positively charged ones, whereas opposite results were observed for Ni/Cr particles and background ions produced in the soft X-ray neutralizer. In addition, the concentration accuracy of PSM and DEG–SMPS are explored after calibration using Ni/Cr particles. The inverted total concentrations by DEG–SMPS are usually underestimated because of the overestimation of penetration efficiency through different modules, whereas the inverted total concentrations by PSM can be either overestimated or underestimated, when the properties of analyte particles are significantly different from the calibration particles. A better understanding on the effects of particle chemical composition and charging state, and their diffusion losses in the instruments will help to diminish the uncertainties in the measurements.Copyright © 2022 American Association for Aerosol Research.