Abstract
The analysis of probe operational parameters such as configuration of the probe, including triggering (measuring) force, stiffness, and length of the stylus, has been performed. A new method allowing three-dimensional (3-D) probe error characteristics with several times more accuracy than the procedure used on a coordinate measuring machine (CMM) has been applied. The analyses have been performed for devices of two types: a single-stage and a two-stage switching probe. The influence of the above-mentioned parameters has been analyzed theoretically and verified experimentally in two planes: perpendicular and parallel to the probe axis. Good agreement between the proposed theoretical model and experimental data has been obtained.
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