Abstract
Factors which influence coercivity, H c, in (Y,Sm,Lu,Ca) 3(FeGe) 5O 12 films and in (Y,Sm,Tm) 3(FeGa) 5O 12 films grown by LPE have been identified. An anomalous layer at the film-substrate interface exhibits coercivity values different from that of the middle, bulk, portion of the film. The contribution of the transient layer at the substrate interface could be reduced by increasing the rotation rate while immersing the substrate into the melt. Films containing Ga show lower coercivities than films containing CaGe possibly because films with Ga are more uniform in composition. Films with Ga show increased coercivities with increasing growth rates and with increasing Sm content throughout the film.
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