Abstract

A very facile and efficient method was supplied to fabricate the large-area orientation RGO films by the interface self-assembly and low-temperature thermal reduction. The structural evolutions of RGO films were systematically investigated by AFM, FT-IR, Raman scattering and XPS spectra. The conductivity and wettability of RGO films with temperature changes were quantitatively evaluated by the four-probe measurement and contacted angle testing. As a result, the RGO films could be well reduced in the 200 ~ 300 °C for 2 h under air atmosphere.

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