Fabrication, structural and electrical characterization of lanthanum tungstate films by pulsed laser deposition

Abstract

Films of lanthanum tungstate, 3μm in thickness, were fabricated by means of pulsed laser deposition on a Pd foil. The films were characterized by X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy and their electrical conductivity was measured at temperatures between 400 and 800°C in different gas atmospheres. The films' structure and electrical characteristics are close to what is reported in the literature for corresponding polycrystalline material. The films exhibit fairly high proton conductivity at elevated temperatures, which make them interesting for components in hydrogen-related technologies. Changes in microstructure and the crystallographic orientation observed at higher temperatures were accompanied by changes in the conductivity characteristics.