Abstract
In this paper, the growth characteristics and superconducting properties of YBCO/CeO2/YBCO multilayer films derived from an all chemical solution deposition process layer by layer are investigated. X-ray diffraction results show that the c-axis epitaxial growth feature of the bottom YBa2Cu3O7-δ (YBCO) film was perfectly inherited. Alternating epitaxial growth of YBCO/CeO2/YBCO multilayer films was confirmed by high resolution transmission electron microscopy in combination with selected area electron diffraction, which will lay the groundwork for preparation of SIS-type Josephson junctions. In addition, nanosized BaCeO3 particle rather than BaCeO3 transition layer was observed in the interface between YBCO and CeO2. The superconductivity measurement results show that the proposal method gives better superconducting properties only for high magnetic field and at low magnetic field it deteriorates the superconducting properties.
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