Abstract
AbstractThin films of V2O5 were prepared using the flash-evaporation technique. Amorphous and polycrystalline samples were characterized by X-ray diffraction, Raman spectroscopy and XPS analysis. The electrical properties of the samples were determined. The effect of either deposition parameters or post-deposition treatments, i.e., annealing in various atmospheres and at different temperatures, on transport properties are presented.Electrochemical characteristics are evaluated in V2O5/LiCIO4-PC/Li microbatteries. The discharge curves present several voltage plateaus, similar to those already observed in cells with bulk V2O5 cathodes. Kinetics of lithium intercalation have been investigated as a function of the growth conditions of V2O5 films. Chemical diffusion coefficient and enhancement factor are calculated as a function of the degree of lithium intercalation. All the results are compared with previous reported results for bulk vanadium oxides. The relationship between the crystallinity of the films and their electrochemical features is also discussed.
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