Abstract
Mesoporous and dense titanium dioxide (TiO2) and silicon dioxide (SiO2) films were deposited directly from nanoparticle colloidal suspensions on quartz using a liquid phase deposition technique. The quartz surface was pre-treated with an -OH group to activate the deposition surface for crack-free adhesion. The deposited films were characterized with the help of scanning electron microscope for microstructural evaluation. An optical profilometer was used to measure the optical properties of the SiO2 film. The reflectance and transmittance patterns of the film were analyzed to determine the index of refraction of the film.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
