Abstract
Abstract We show that it is possible to fabricate topographic submicron features in a side-chain azobenzene polyester with a scanning near-field optical microscope. Through irradiation at a wavelength of 488 nm at intensity levels of 12 W/cm 2 , topographic features as narrow as 240 nm and as high as 6 nm have been reproducibly recorded in a thin film of the polyester. These observations are consistent with the fact that at low intensities peaks are produced evolving into formation of trenches at high intensities in the case of amorphous side-chain azobenzene polyesters. This may find applications in high-density optical storage and high-resolution lithography.
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