Fabrication of high aspect ratio AlN nanopillars by top-down approach combining plasma etching and wet etching

Abstract

This study proposes a top-down approach for fabricating high aspect ratio AlN pillars with m-oriented nonpolar sidewalls, which will serve as the first building block for the fabrication of core-shell UV-LEDs. Such structures are achieved through a two-step process, combining a chlorine plasma etching, followed by a wet chemical etching with KOH. In this work, the mechanisms driving the AlN etching in chlorine plasma are discussed. In particular, we highlight the impact of the ratio between ion flux and radical flux on AlN etch rates, pillar profiles, and crystal orientation-dependent etching. We also identify two mechanisms of passivation layer formation on the pillar sidewalls that contribute to the pattern slope: redeposition of the carrier wafer etch by-products and Aluminium line of sight redeposition, both phenomena are also driven by the ionic bombardment. Low ionic bombardment (either low ion over radical flux ratio or low ion energy) has been identified as plasma conditions allowing the patterning of anisotropic AlN pillars but with the formation of a-nonpolar facets. Due to the inability to obtain m-oriented sidewalls using Cl2 plasma etching alone, we show that the use of a KOH wet etching treatment allows verticalizing the pillars and revealing smooth m-facets on the pillars’ sidewalls if suitable m-oriented hard mask is used. In this wet etching step, we highlight the key role played by the hard mask and its initial shape during the wet etching if straight and m-oriented pillars are desired.