Abstract
Gold nanowires were fabricated using a contact mode atomic force microscope (AFM), the tip of which scans a thin gold layer predeposited on a mica substrate. The nanowires are spaced with an interval in the range of 130–590 nm. Their widths and heights are distributed in the range of 70–110 nm and 4–7 nm, respectively. By adjusting the strength of the force applied by the AFM tip, the spacing, width and height of the nanowires can be controlled and made to increase as the applied force increases. Scanning an extensional area enabled us to fabricate long nanowires.
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