Abstract

Silicon anisotropic wet etching is applied for fabricating round-shaped micro-structures in a size range of sub-microns. In this work, we demonstrate that arbitrary 2-D mask patterns having curved profile can be successfully transferred to deep-etched cavity profiles on a Si {100} wafer. The sub-micron mask is directly drawn on the Si wafer by irradiating focused ion beam to the wafer surface. Anisotropy in etch rate of Si using tetra-methyl ammonium hydroxide solution was modified and controlled by adding a surfactant Triton X-100 to the solution. Etched profile was conformal to etch mask patterns having smooth curvatures.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call