Abstract
Silicon anisotropic wet etching is applied for fabricating round-shaped micro-structures in a size range of sub-microns. In this work, we demonstrate that arbitrary 2-D mask patterns having curved profile can be successfully transferred to deep-etched cavity profiles on a Si {100} wafer. The sub-micron mask is directly drawn on the Si wafer by irradiating focused ion beam to the wafer surface. Anisotropy in etch rate of Si using tetra-methyl ammonium hydroxide solution was modified and controlled by adding a surfactant Triton X-100 to the solution. Etched profile was conformal to etch mask patterns having smooth curvatures.
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