Abstract
In the present work, pure copper ferrite (CuFe2O4) thin film has been grown on clean glass substrate by using the spray pyrolysis deposition technique. All the necessary parameters were optimized before the deposition. The deposited thin film was annealed at 500°C for 4 h and then cooled to room temperature. X-ray diffraction (XRD) technique was used to study the phase purity and crystal structure of the sample formed on the thin film. The analysis of the X-ray diffraction pattern reveals the formation of a single-phase cubic spinel structure. The lattice constant and other structural parameters calculated from XRD data are in good agreement with the reported data.
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