Abstract
The aluminum nitride (AlN) heterostructures were successfully grown on silicon substrate by plasma-assisted molecular beam epitaxy. The surface morphology and structural and optical properties of the sample have been investigated by reflection high electron diffraction, scanning electron microscopy, field emission scanning electron microscopy (FESEM), energy dispersive X-ray, high-resolution X-ray diffraction (HR-XRD), Raman spectroscopy, and photoluminescence, respectively. HR-XRD measurement showed that the sample has a typical diffraction pattern of hexagonal AlN/GaN/AlN heterostructures. The Schottky characteristic of Pt contact on AlN/GaN/AlN heterostructures was also investigated under different annealing temperatures in nitrogen ambient. The temperature dependence and structural evolution of the Schottky barrier height (SBH) of Pt contacts were studied using the current–voltage measurement and FESEM, respectively. Our findings presented that the SBH of the samples change with different annealing temperatures.
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