Fabrication of 5 cm long epitaxial Sm0.2Ce0.8O1.9−x single buffer layer on textured Ni–5%W substrate for YBCO coated conductors via dip-coating PACSD method

Abstract

Five centimeters long epitaxial Sm0.2Ce0.8O1.9–x (SCO) single buffer layer for YBCO coated conductors was deposited via dip-coating polymer-assisted chemical solution deposition (PACSD) approach on bi-axially textured Ni–5%W (200) alloy substrate. The film formation and texture evolution were investigated using X-ray diffraction and scanning electron microscopy. Flat, dense and crack-free SCO films with sharp (200) c-axis texture were obtained by way of carefully controlling the concentration of precursor solution, withdrawing speed, annealing temperature and dwelling time. On consideration of both microstructure and texture, epitaxial SCO single buffer layers were fabricated using precursor solution of 0.3M cationic concentration, the withdrawing speed of 10mm/min and heat treatment at 1100°C in Ar–5%H2 mixture gas for 0.5h. Epitaxial YBCO thin films with a homogeneous surface microstructure were deposited on the SCO-buffered NiW substrate via dip-coating PACSD approach. The PACSD approach was a promising way to fabricate long and low-cost YBCO coated conductors.