Abstract
A particle detector for high flux applications has been fabricated based on highly oriented diamond (HOD) films. Relatively thick HOD films were achieved by combining the bias enhanced nucleation (BEN) in a microwave plasma chemical vapor deposition (MPCVD) reactor and high rate growth process in a low pressure combustion flame (LPCF) reactor. Following the diamond deposition, Si substrate was etched away to obtain a free standing, 4 mm diameter diamond membrane. A Ti/Au microstrip electrode pattern was applied to one side of the detector to provide spatial resolution. The detector performance was tested by measuring the energy spectra of α-particles emitted from an 241 Am source. As compared to the performance of a polycrystalline diamond detector, the HOD detector showed a three to four fold improvement in performance, which was close to that obtained for single crystalline diamond detectors.
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