Abstract

A fluorine-free chemical solution deposition (CSD) method has been developed to fabricate YBCO epitaxial films and SmBiO3 or Sm-doped CeO2 (SCO) buffer layers on crystal substrates and textured Ni5%W metal substrates. The critical current density, Jc, is over 4 MA/cm2 for YBCO deposited on crystal substrates, over 3 MA/cm2 on SmBiO3-buffered single crystal substrates, and it reaches 1 MA/cm2 on a (Sm,Ce)O2-buffered metal substrate, demonstrating the feasibility of an all-CSD method for fabricating high quality coated conductors.

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