Abstract
CsI(Tl) scintillation films with columnar structure are now widely used for X-ray imaging. In this work, CsI(Tl) films were manufactured on glass substrates by the thermal deposition method. The influence of deposition conditions on the microstructure and crystalline property of the films was studied by scanning electron microscopy (SEM) and X-ray diffraction (XRD). The films showed only (200) plane preferred orientation when deposited at low vacuum. The light outputs were evaluated. The films with only one preferred orientation showed better luminescence performance than that with several crystal planes. In addition, the spatial resolution of samples was given in terms of modulation transfer function (MTF).
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