Abstract
The preparation, morphology and basic electrical properties of carbon/polyesterimide (PEI) thick film resistors are presented. SEM observations have been used for microstructure investigation. The influence of carbon (conductive carbon black (CB) or graphite (G)) and the effect of an inorganic filler (TiO 2) on sheet resistance, normalized temperature dependence of resistance, durability to thermal shocks and moisture behaviour of two- and three-component systems are discussed.
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