Abstract
We have investigated the tunneling properties of proximity-effect superconductor-normal-superconductor junctions based on high-temperature superconductor YBCO thin films and normal Ag layer. The systematic analysis of the properties of the films and the fabrication process which leads to a good-quality junctions is discussed in detail. The properties of the tunneling barrier are investigated by dc and rf measurements: the dc properties reveal that our junctions fully behave as expected from the de Gennes model. Regular Shapiro steps in the current–voltage characteristics are obtained as a result of microwave irradiation, indicating reliable rf properties of the junctions.
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