Abstract
The core device of Modern programmable Josephson voltage standard is Josephson junction array. The most advantageous Josephson junction array is Nb/NbxSi1-x/Nb material array. The advantages of Nb/NbxSi1-x/Nb material Josephson junction are that three-layer film production process is simple, Nb and NbxSi1-x etching processes are the same and NbxSi1-x potential barrier layer components can be easily adjusted. In this paper, we investigate the NbxSi1-x/Nb single Josephson junction in National Institute of Metrology. Through measuring the dc current-voltage characteristics under low temperature (4.2 K), superconducting tunneling current and a zero voltage state jumping to voltage state are observed clearly, finally the measurement results are discussed. The work is the first study on Nb/NbxSi1-x/Nb single Josephson junction in China.
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