Fabrication and characterization of silicon nanowires with MACE method to influence the optical properties

Abstract

We are presenting here fabrication of silicon (Si) nanowires (NWs) arrays by using Si (100) wafer as substrate, by metal assisted chemical etching (MACE) method. The Si-NWs growth on the Si wafer has been done by using etching time of 45 min in etching solution of hydrogen fluoride and hydrogen peroxide. X-ray diffraction (XRD) has been used for the structural analysis of NWs to estimate the crystalline size, micro-strain, dislocation density of fabricated nanostructures. The surface morphology of Si-NWs array has been studied through field effect scanning electron microscopy (FE-SEM). The optical properties like energy band gap of fabricated Si-NWs has been carried out through UV–Vis diffuse reflectance spectroscopy (UV DRS) and photoluminescence (PL) spectroscopy.