Abstract
Both CuI and CuI:Zn semiconductor thin films, along with MSM-structured UV photodetectors, were prepared on flexible mica substrates at low temperature (150 °C) by a wet chemical method. The two CuI-based films exhibited a polycrystalline phase with an optical bandgap energy close to 3.0 eV. Hall effect measurements indicated that the CuI thin film sample had p-type conductivity, while the CuI:Zn thin film sample exhibited n-type conductivity, with the latter showing a higher carrier mobility of 14.78 cm2/Vs compared to 7.67 cm2/Vs for the former. The I-V curves of both types of photodetectors showed asymmetric rectification characteristics with rectification ratios at ±3 V of 5.23 and 14.3 for the CuI and CuI:Zn devices, respectively. Flexible CuI:Zn devices exhibited significantly better sensitivity, responsivity, and specific detectivity than CuI devices both before and after static bending tests. It was found that, while the optoelectronic performance of flexible CuI-based photodetectors degraded under tensile stress during static bending tests, they still exhibited good reproducibility and repeatability in their photoresponses.
Published Version
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