Abstract
Copper nanowires were fabricated by electrochemical deposition inside anodic alumina template anodized on aluminum substrate. The morphology, composition and structure of the copper nanowires were characterized by means of scanning electron microscopy (SEM), transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), energy-dispersive (EDS) and X-ray diffraction spectroscopy (XRD). The results revealed that copper nanowires were dense, continuous, highly-crystalline and uniform with diameters. The electrical properties of copper nanowires wrer characterized with two-terminal electrical measurements. Different current-voltage (I-V) characteristics of single copper nanowire were observed and possible conductive mechanisms were discussed. The crystalline copper nanowires are promising in application of future nanoelectronic devices and circuits.
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