Abstract
Fabrication and Characterization of Boron-Implanted Silicon Superconducting Thin Films on SOI Substrates for Low-Temperature Detectors
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
https://doi.org/10.1007/s10909-024-03122-0
Journal: Journal of Low Temperature Physics | Publication Date: May 3, 2024 |
Fabrication and Characterization of Boron-Implanted Silicon Superconducting Thin Films on SOI Substrates for Low-Temperature Detectors
Join us for a 30 min session where you can share your feedback and ask us any queries you have