Abstract
In this paper, a force sensor based on piezoelectric effect of Li-doped ZnO (LZO) thin films was presented, which constituted by Pt/LZO/Pt/Ti functional layers and Si cantilever beam. The chips were designed and fabricated by micro electro-mechanical system (MEMS) technology on silicon wafer with [Formula: see text] orientation. In this sandwich structure, the top electrode (TE) was Pt and bottom electrode (BE) was Pt/Ti, LZO piezoelectric thin films were prepared by radio frequency (RF) magnetron sputtering method. The microstructure and morphology were analyzed through X-ray diffraction (XRD) and field emission scanning electron microscope (FE-SEM), analysis results shows that the LZO thin films with highly c-axis orientation and uniform grain size distribution under sputtering power of 220 W. The experimental results show, when external force loaded on the tip of the beam, the output voltage [Formula: see text] was 280.3 mV at external force of 5 N, the sensitivity of the proposed sensor was 46.1 mV/N in the range of 1–5 N.
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