Abstract
AbstractOrganic field‐effect transistors were fabricated using a domain‐ordered copper phthalocyanine (CuPc) thin film as the active layer prepared by weak epitaxial growth (WEG) technology. CuPc was deposited onto α‐sexithiophene (α‐6T) and α,ω‐dihexylsexithiophene (α,ω‐DH6T) films acting as the epitaxial substrate to realize the domain‐order growth. As a result, the thin‐film morphology of CuPc exhibits many re‐ gional domain‐ordered structures measured by atomic force microscopy and X‐ray diffraction. The field‐effect mobilities are 0.11 and 0.085 cm2/Vs for the devices with CuPc/α‐6T and CuPc/α,ω‐DH6T, respectively. The threshold voltages were –7 V and –13 V for CuPc/α‐6T and CuPc/α,ω‐DH6T, respectively. The improved device performance could be attributed to the domain‐order structure of the CuPc thin film. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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More From: physica status solidi (RRL) – Rapid Research Letters
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