Fabric defect detection based on sparse representation of main local binary pattern

Abstract

PurposeThe purpose of this paper is to find an efficient fabric defect detection algorithm by means of exploring the sparsity characteristics of main local binary pattern (MLBP) extracted from the original fabric texture.Design/methodology/approachIn the proposed algorithm, original LBP features are extracted from the fabric texture to be detected, and MLBP are selected by occurrence probability. Second, a dictionary is established with MLBP atoms which can sparsely represent all the LBP. Then, the value of the gray-scale difference between gray level of neighborhood pixels and the central pixel, and the mean of the difference which has the same MLBP feature are calculated. And then, the defect-contained image is reconstructed as normal texture image. Finally, the residual is calculated between reconstructed and original images, and a simple threshold segmentation method can divide the residual image, and the defective region is detected.FindingsThe experiment result shows that the fabric texture can be more efficiently reconstructed, and the proposed method achieves better defect detection performance. Moreover, it offers empirical insights about how to exploit the sparsity of one certain feature, e.g. LBP.Research limitations/implicationsBecause of the selected research approach, the results may lack generalizability in chambray. Therefore, researchers are encouraged to test the proposed propositions further.Originality/valueIn this paper, a novel fabric defect detection method which extracts the sparsity of MLBP features is proposed.