Extremely low coefficient of friction of diamond sliding against Ag thin films on Si(1 1 1) surface under ultrahigh vacuum condition

Abstract

The tribological properties of a diamond (1 1 1) pin slid on subnanometer thick Ag films, which were deposited on a cleaned Si(1 1 1) substrate, were studied using a pin-on-plate tribometer. The preparation of Ag ultrathin films and frictional experiments were performed in an ultrahigh vacuum (UHV) chamber at a pressure of 10 −8 Pa. The frictional experiments were carried out at a sliding speed of 0.1 mm/s and at a normal load of 250 mN. An extremely low coefficient of friction, less than 0.01, was obtained when the pin was slid on Ag films, whose thicknesses were 1 and 2.6 monolayer (ML) under reciprocal motion. The minimum coefficient of friction was less than 0.004 for Ag 1 ML film. After the extremely low coefficient of friction was obtained, Ag remained on the worn track without any transfer to the diamond pin, as confirmed by Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). The mechanisms of extremely low coefficients of friction are discussed in terms of the chemical bonding force between atoms of the topmost layers, and Ag coverage on the Si surface.