Abstract
A plug-in (EXTRAX) has been developed forImageJ– a public domain Java-based program widely used for image processing and analysis in microscopy. This plug-in allows the extraction and measurement of intensities from electron diffraction spot patterns with a semi-automatic peak location based on a two-dimensional lattice given by the user. It is also possible to take into account supplementary spots originating from high-order Laue zones and/or the existence of a modulation vector.
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