Abstract
We describe a combined backscatter Mossbauer spectrometer and X-ray fluorescence analyzer (BaMS/XRF) instrument suitable for planetary missions to the surfaces of Mars (MESUR Program), the Moon, asteroids, or other solid solar-system objects. The BaMS/XRF instrument is designed to be capable of concurrent analysis of a sample for its elemental abundances (XRF) and for the mineralogy of its iron-bearing phases (BaMS) without any sample preparation.
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