Abstract
The $1/f$ resistance noise has been measured in thin CuMn (13.5 at.%) spin-glass films. The temperature and frequency dependence have been analyzed in terms of the landscape of free-energy barriers. This analysis provides the full barrier distribution for various thin film thicknesses between 10 nm and 80 nm. The free-energy barrier height distribution's width and energy position have been determined. Contrary to previous models with fixed shape and energy, the free-energy landscape is described by a distribution of barriers that both shifts and changes shape as the temperature is reduced. The dependence of this distribution is in contrast with recent predictions. Using the fluctuation dissipation theorem, the $1/f$ measurements connect with ${\ensuremath{\chi}}^{\ensuremath{''}}$, displaying agreement with other direct measurements of the latter.
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