Abstract
In this paper, we introduce a novel approach to recognize stem-calyx of an apple using multifractal dimension. Our method comprises of steps such as preprocessing using bilateral filter, segmentation of apple using grow-cut method, multi-threshold segmentation is used to detect the candidate objects such as stem-calyx and small defects. The shape features of the detected candidate objects are extracted using Multifractal dimension and finally stem-calyx regions are recognized and differentiated from true defects using SVM classifier. The proposed algorithm is evaluated using experiments conducted on apple image dataset and results exhibit considerable improvement in recognition of stem-calyx region compared to existing techniques.
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