Abstract
Grain boundary (GB) misorientation determines the transport properties of REBa2Cu3O7 (REBCO) superconducting films (rare earth (RE)). In this study, the misorientation angles between the adjacent grains in a Y0.9Sm0.1Ba2Cu3O7 (YSBCO) epitaxial superconducting film on buffers performed via ion‐beam‐assisted deposition have been characterized using transmission electron microscopy. The in‐plane and out‐of‐plane misorientation at GBs and sub‐GBs has been separated from the total misorientation. Most of the GB misorientation angles are smaller than 5°, with the in‐plane component γ<3° and out‐of‐plane components α≤1° and β<2°. This study provided a relatively simplified, practical, and useful method for determination of GB misorientation angles and separation of the in‐plane and out‐of‐plane misorientation from the total misorientation for epitaxial REBCO superconducting films.
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