Abstract

We demonstrate a new all-optical method to measure absorption coefficients in any family of as-grown nanowires, provided they are grown on a substrate having considerable difference in permittivity with the nanowire-air matrix. In the case of high crystal quality, strain-free GaN nanowires, grown on Si (111) substrates, the extracted absorption coefficients do not exhibit any enhancement compared to bulk GaN values, unlike relevant claims in the literature. This could be attributed to the relatively small diameters, short heights, and high densities of our nanowire arrays.

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