Abstract
We demonstrate a novel method for obtaining optical constants of transparent material over a broad terahertz spectral range from 0.7 THz to 7.5 THz at room temperature. Based on the interferogram directly acquired by a Fourier transform infrared spectrometer (FTIR), multiple beam interference principle combining Fresnel's formula is employed to extract the refraction index and the extinction coefficient, which are the basis for calculating permittivity. It avoids the shortcomings using Kramers-Kronig (K-K) relations and overcome the frequency range of terahertz time-domain system (TDS). Moreover, this method has better stability and reserves all useful information for thin samples compared with TDS, which makes it a general processing method for terahertz dielectric measurement.
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