Abstract
A modification in the experimental setup of the conventional frequency mapping method — a frequency domain electron beam testing method - has been developed, which allows a spectrum analysis of voltage signals on IC interconnections in a significant shorter measurement time. The main instrument is a swept spectrum analyzer, whose internal voltage controlled oscillator and intermediate frequency filter are used in a special measurement arrangement. As with the conventional frequency domain measurement methods, this new method requires no synchronization of the blanking frequency and the clock frequency of the IC, so it is especially well suited for investigations of asynchronous circuits.
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