Abstract
Extended X-Ray Absorption Fine Structure (EXAFS) is a spectroscopic technique which allows the determination of the atomic structure of materials. EXAFS can be used to determine nearest neighbor identity, coordination number, interatomic distance and degree of disorder, and therefore is particularly useful for investigation of the atomistic structure of composite interfaces. Using EXAFS and related techniques, the structure of an interface can be investigated in a non-destructive manner. After a brief description of the EXAFS technique, its utility will be demonstrated through a study of vanadium barriers at aluminum-graphite interfaces. It is found that the vanadium reacts strongly, forming vanadium oxide and carbide, while little unreacted metallic vanadium remains.
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