Abstract
EXAFS-like features in energy loss spectra (known as EXELFS) were observed by using an imaging energy filter built into an electron microscope. Single crystal micro-platelets of MgO were used as test samples. Extended fine structures were obtained reproducibly in the energy range up to 150 eV beyond the OK, MgK and MgL edges. Comparison with single scattering calculations for the K edges showed a fair agreement, indicating the feasibility of this type of analysis.
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