Abstract
An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found in characteristic X-ray fluorescence spectra, originating from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The Al-Al interatomic distances are successfully reproduced by the Fourier transform of the fine structure. Thus, the present method has the potential to become a convenient alternative to EXAFS measurement for light elements.
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