Abstract
The lack of effective run-time diagnostics is a major irritant in the discrete manufacturing industry. This is partly attributed to the ubiquitous ladder logic diagrams (LLD) used to process the factory information for control and diagnostics. In this paper, we examine the efficacy of LLDs to produce useful diagnostics. For this, we have followed and extended the event signature (ES) method proposed by Chand (1992). Our study shows we can extract useful diagnostic knowledge from the control logic in the form of LLD and this refines the diagnosis related to input sensors in the factory. Predefining suitable run-time experiments for anticipated faults helps in further localizing the fault.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.