Abstract
Express analysis of the dependence of the critical temperature of different superconducting films on its thickness was proposed, developed, and tested. The technique is based on a mathematical analysis of an integral equation that describes a one-time measurement of the electrical resistance temperature dependence of a sufficiently long superconductor film with variable thickness. The dependence of the film thickness and width along its longitudinal coordinate (film geometry) is set or measured using known methods. The express analysis has significant advantages over the more labor-consuming method of time-shared measurement of the critical temperature of film segments with different thicknesses.
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