Abstract

The article analyzes experimentally and theoretically the influence of microscope parameters on the pinhole-assisted Raman depth profiles in uniform and composite refractive media. The main objective is the reliable mapping of deep sample regions. The easiest to interpret results are found with low magnification, low aperture, and small pinholes. Here, the intensities and shapes of the Raman signals are independent of the location of the emitter relative to the sample surface. Theoretically, the results can be well described with a simple analytical equation containing the axial depth resolution of the microscope and the position of the emitter. The lower determinable object size is limited to 2–4 μm. If sub-micrometer resolution is desired, high magnification, mostly combined with high aperture, becomes necessary. The signal intensities and shapes depend now in refractive media on the position relative to the sample surface. This aspect is investigated on a number of uniform and stacked polymer layers, 2–160 μm thick, with the best available transparency. The experimental depth profiles are numerically fitted with excellent accuracy by inserting a Gaussian excitation beam of variable waist and fill fraction through the focusing lens area, and by treating the Raman emission with geometric optics as spontaneous isotropic process through the lens and the variable pinhole, respectively. The intersectional area of these two solid angles yields the leading factor in understanding confocal (pinhole-assisted) Raman depth profiles.Graphical abstractSpearfishing is a well-known example of the effects of refraction at the boundary between two index-mismatched media. The object Greal is seen, due to refraction, as Gvir from the angle β (without knowing the depth position). The real position is obtained under the angle α. In a microscope (see inset), index mismatch deforms the image point of Greal into an image line. The pinhole substantially reduces deformations and allows the determination of the position of the point emitter G. (Cartoon designed by Sofia Anker)

Highlights

  • Scanning Raman micro-spectroscopy is an elegant tool for the chemical characterization and localization of small objects, especially when they are distributed in two dimensions on a planar substrate [1,2,3]

  • The spatial resolution is limited with conventional microscopy in the visible region to 2wZ ≈ 600 nm (FWHM) [8]

  • The experimental results are accompanied by theoretical calculations based on literature work on electromagnetic diffraction [20,21,22,23,24,25,26,27], Gaussian beam [26, 28], and geometric optics approaches [29, 30]

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Summary

Introduction

Scanning Raman micro-spectroscopy is an elegant tool for the chemical characterization and localization of small objects, especially when they are distributed in two dimensions on a planar substrate [1,2,3]. The spatial resolution is limited with conventional microscopy in the visible region to 2wZ ≈ 600 nm (FWHM) [8] Up to this limit, the thickness of objects can directly be determined with high accuracy from the intensity of the Raman signal [9, 10]. A depth scan of the sample can deliver, among others, the axial resolution of the setup, the thickness of the complete sample, and the positions of its components, as well as the angular and radial intensity distribution of the irradiation source These parameters are covered in this article investigating polymer samples with coplanar smooth phase boundaries and negligible elastic scattering power. These properties will be described in a follow-up contribution

Materials and methods
Objective
Evaluation procedures
Experimental results
Discussion and conclusion
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