Abstract
The effects of metal insertion (iron, cobalt and nickel) into 1T-CdI 2-type TiS 2 layered crystals, expressed as M x TiS 2, have been studied by X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM) and band structure calculations (FLAPW method). The stoichiometry x=1/4 was chosen because of specific crystallographic features of the compounds studied. We focused our interest on the role played by chalcogen atoms. S 2p core spectra are found to depend strongly on their chemical surroundings (Ti or Ti and M) and on the guest metal. We imaged the top sulfur plane (001) for Fe 1/4TiS 2, Co 1/4TiS 2 and Ni 1/4TiS 2 and note that the results also depend on the compound considered. Theoretical calculations have been carried out in order to improve our knowledge of the electronic structure of M 1/4TiS 2 compounds and attempts are made to rationalize the experimental data.
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