Abstract
The random coupling model (RCM) and Baum-Liu-Tesche EM topology have been well developed to describe the statistical fluctuation of the scattering and impedance matrices of wave-chaotic metallic-enclosed cavity, and the interaction of interconnected networks of complicated enclosures, respectively. In this paper, a stochastic approach that combines these two methods is tested and verified on a network of wave-chaotic metallic cavities, and induced voltage derived by this method is also compared with other methods.
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