Abstract

In this paper several new methods are presented whereby successive laser probe scans can be used to measure the reflection coefficient and velocity perturbation for a grating structure on a surface acoustic wave substrate. These techniques can be used to evaluate the perturbations presented by any overlay material arranged in a grating structure. This includes etched grooves, evaporated metals, and deposited dielectrics. The methods utilize the results presented previously [J. Appl. Phys. 60, 3532 (1986)] which indicate that the propagation of a beam profile can be very accurately predicted if a carefully measured slowness surface is used in conjunction with the angular spectrum of the plane-waves diffraction theory.

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