Abstract

Molybdenum disulfide (MoS2) has attracted more widespread interest due to its unique structure and thermoelectric properties. Herein, a suspended microelectrode is applied to measure the thermal conductivity of monolayer and multilayer MoS2, and the thermal rectification coefficient is obtained based on it. Combined with numerical simulation, the differences between the thermal conductivity and thermal rectification effect of the monolayer and multilayer MoS2 films are investigated. Moreover, three samples with different angles are employed to study the relation between thermal rectification coefficient and geometrical asymmetry by focused ion beam technology. The results demonstrated that the thermal conductivity of the monolayer film is greater than that of the multilayer, and both of them decreases with the increasing temperature and layers, while the thermal rectification coefficient increases with the increasing angles, and is almost independence on temperature and layers.

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